Nearfield Systems Inc.
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About
NSI EXHIBITS AT AMTA ASIA 2005
| June 8, 2005 - Greg Hindman and Daniel Janse van Rensburg, attended AMTA Asia in Hong Kong from 5-8 June 05. AMTA's first event in Asia consisted of a short course on antenna testing by Gary Thiele of Wright-Patterson AF Labs in Dayton, presentations by a selection of other speakers (see below) and an exhibit with 14 companies, including NSI. |  |
Summary of Lectures:
| Lecture | Title | Presenter |
| 1-3 | Overview of Antenna Test Methods | Gary Thiele |
| 4 | Testing of high gain antennas | Daniel Janse van Rensburg, Nearfield Systems (NSI) |
| 5 | Testing of low gain antennas | Edwin Cheng, Satimo |
| 6 | Antenna measurement for wireless networking | Ike Lin, Wavepro |
| 7 | Compact range antenna test technology | Marcel Boumans, Orbit/FR |
| 8 | Measurement instrumentation | Don Bodnar, MI Technologies |
| 9 | Measurement facilities | Teh-Hong Lee, Ohio State University |
| 10 | Propagation measurements in an urban environment | Randy Jost, Utah State University |
| 11 | Mobile antenna measurement techniques | Kefeng Liu, ETS-Lindgren |
There was also a technical tour to the City University of Hong Kong where
we saw an OFR CNF
antenna range, a Mission Research compact range and an NSI 3x3 PNF/CNF
system.
Photos from AMTA Asia: |
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For more information on how to take advantage of near-field antenna measurements, contact the NSI Sales Department.