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July 15, 2006 Near-field
Systems
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NSI
at AMTA Europe 2006 "Reflection Suppression To Improve Anechoic Chamber Performance" by Greg Hindman and Allen Newell "An introduction to Mobile Station Over-the-Air measurements" by Greg Masters ________ NSI
at CTIA ________ NSI
at LAPC See NSI at these tradeshows in 2006 IEEE AP-S, July 9 - 14, Albuquerque, NM AMTA
Denver 2006, July 21, Denver, CO NSI Customer Earns Best Manufacturing Practices Award Northrop Grumman Corporation's Electronic Systems Sector has been nationally-recognized as Best Manufacturing Practices (BMP) as part of a unique industry and government cooperative effort. Among the areas surveyed at Northrop Grumman's Baltimore operations were design, test, production, facilities and management. Examples of best practices included the innovative use of commodity design teams, production test cells, rapid prototyping, supplier logistics, and electronic component procurement, among other areas. The need to test large quantities of production antennas led Northrop Grumman Electronic Systems to adopt proven Commercial- Off-The-Shelf Near-field Scanning Technology and its associated software and to use Near-field Production Test Cells instead of compact ranges. This has enabled Northrop Grumman Electronic Systems to realize a 50% reduction in the time required to test an antenna, enhanced measurement capabilities, and a 70% reduction in floor space requirements for the test facility. The Near-field
Test Cells used by Northrop Grumman were supplied by Nearfield Systems
and are based on the NSI-500H-6x6
Planar Near-field Scanner, NSI
Panther 6000 Receiver and NSI
2000 Software. NSI also supplied the Anechoic
Chamber, Laser
Alignment System, RF
Subsystem and other key components of the production test cells. NSI
Announces New 3D Spherical Near-field System, NSI-700S-20 __________ NSI
Is Now Shipping A Fast RF Source, NSI-RF-7020 __________ NSI
Offers Method for Reducing Range Reflections _________ NSI 2000 Includes 3D Viewer NSI 2000 now includes
a 3-D viewer
that can be used to inspect near-field and far-field data in a 3-D dynamic
mode, which can help you gain insights into your antennas performance.
For more information, see: __________ See
Near-field 101 for Practical Info __________ Learn
More About Antenna Measurements - Upcoming
Short Courses __________
Nearfield
Systems Inc. Tel: 310-525-7000
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