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June 15, 2010

 

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NSI is now ISO 9001:2008 Registered

NSI passed its ISO 9001:2008 certification audit June 1 and has been recommended for full certification to the 2008 standards by ISO registrar, AFQA-EAQA of LONDON. NSI has been an ISO 9001 registered company since February 1999. NSI received ISO:2000 certification in October 2003.

The ISO 9001:2008 registration qualifies and validates the company's continued commitment to quality and its ability to maintain the most up to date certifications as well as deliver the highest quality products and customer service. NSI is committed to continuous process improvement that is integral to ISO 9001 quality procedures.

ISO Registration ensures customers that NSI has demonstrated full control over the quality of its products, including the design, development, manufacturing, verification, and servicing of its antenna measurement products and services. NSI Chief Executive Officer, Greg Hindman, said, “Our continued ISO certification is part of our commitment to deliver the highest quality products at the lowest possible price and back them up with the highest levels of customer support.”

For more information on NSI's ISO 9001 certification or its products, contact us at sales@nearfield.com.

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Intro to NSI Scripting Training Session

NSI will be conducting its first WebEx based training module on August 11th, 2010 at 11:00 AM Pacific Daylight Time.  This 30 minute session will cover NSI software scripting basics and will be presented by Bert Schluper, NSI Senior RF Engineer at NSI.  The session will be followed by 10 to 15 minutes of interactive discussion where questions from participants will be fielded.

If you are interested in participating, please send an e-mail to Hilda Hernandez at HHernandez@nearfield.com with a request to be added to the attendee list. The number of attendees will be limited to 24. We will send out details on how to access the WebEx training session closer to the date.

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NSI Exhibits at IMS 2010

NSI attended the IMS 2010 (annual conference and exhibition of the IEEE Microwave Theory and Techniques Society) in May and exhibited our NSI-700S-20 spherical near-field measurement system. The test system was paired with an Agilent PNA-X, allowing us to do live antenna measurement demonstrations during the show. NSI exhibited as part of the ‘Agilent Avenue’ display. This year’s conference was held at Anaheim Convention Center in Anaheim, CA, from May 23-28, and attracted almost 10,000 participants. Engineers, researchers, designers, academics and executives in the microwave and RF industry gathered to learn and exhibit the latest advances in RF electronics.

The exhibit floor saw tremendous activity, where 556 companies from nearly 40 countries were represented. This year, IMS2010 included 63 new exhibitors. The 60 technical sessions included 250 technical papers.

IMS2011 will be held June 5-10, 2011, at the Baltimore Convention Center in Baltimore, MD, and we hope to see you there.

IMS2010-Dan Slater
 
IMS2010-Exhibit

NSI Vice President and Co-Founder Dan Slater (far right) speaks with customers at IMS 2010. NSI's Hilda Hernandez and Eddy Park (from left) listen in.

 
NSI Exhibit at IMS 2010
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NSI Installs First Near-field System in The Kingdom of Saudi Arabia

In April, NSI completed the installation of our first near-field antenna measurement system in The Kingdom of Saudi Arabia.  The turn-key, NSI-200V-3x3 planar near-field system was installed at a major university and will be used for research, development, and education. This is the first near-field antenna measurement system to be installed in this country and as a result, received the attention of the entire local academic community.

The NSI-200V-3x3 is an ideal system for measuring medium and high gain antennas (>15 dBi) with small apertures making it suitable for testing feeds and small array or reflector antennas. This system interfaces with a wide variety of RF equipment and is capable of measuring amplitude and phase patterns from S-band to mmWave bands.  The Model 200V-3x3 can be supplied with a variety of options and easily upgraded to allow for cylindrical or spherical measurements.  This small, light weight system is easy to assemble and align, and can be quickly dismantled for relocation or storage.  Please contact the NSI Sales Department to request additional information or a quotation for our NSI-200V-3x3 system, or other NSI products and solutions.

 

Nearfield in Saudia Arabia

Saudi Arabia's first Near-field Test Antenna Measurement System

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NSI Attends EuCap 2010

NSI was an exhibitor at the 4th European Conference on Antennas and Propagation (EuCAP) held 12-16 April 2010 at the Barcelona International Convention Centre in Barcelona, Spain.  Dr. Stuart Gregson (NSI European Regional Sales Manager) presented a paper entitled Advances in Cylindrical Mathematical Absorber Reflection Suppression as part of the AMTA convened sessions. The paper provides an introduction to new measurement techniques used to reduce range multi-path effects with cylindrical antenna measurement systems and also discusses recent advances in the MARS (Mathematical Absorber Reflection Suppression) frequency domain measurement and post processing technique. Click Here to download the full paper.

EuCap provided a great opportunity to meet with many of our existing customers and to demonstrate the speed and simplicity which with antenna measurements can be taken with the NSI-700S-20 spherical near-field system, which was showcased in the NSI exhibit booth this year. 

Unfortunately, this event was perhaps most notable in the minds of many of the attendees as midway through the conference an eruption beneath Iceland's Eyjafjallajokull glacier created an ash cloud that forced airspace closures across much of northern Europe, disrupting hundreds of thousands of peoples travel plans including ours!

EuCap-Kim and Stuart
 
EuCap-Daniel

Kim Hassett and Stuart Gregson man the NSI booth...

 
...while Daniel Janse van Rensburg takes a dinner break with Samantha Hassett and Leili Shafai.
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UCLA 2010 Short Course

UCLA Extension presented the annual Microwave Antenna Measurements short course from 11-14 May 2010 in Los Angeles. NSI provides sponsorship for this course each year through lectures and a NSI hosted reception for all attendees and lecturers.  At this year’s event, there were a record 37 attendees and the lectures were presented by the following industry leaders:

Doren Hess - MI Technologies
Don Bodnar - MI Technologies
Dayel Garneski - Raytheon
Per Iversen - Orbit/FR
Daniël Janse van Rensburg - NSI
Kefeng Liu - ETS-Lindgren
Dean Mensa - USN Retired
Carl Stubenrauch - NIST retired
Yahya Rahmat-Samii - UCLA

The course is intended for engineers, scientists, engineering managers, and practicing antenna measurement technicians who need to quickly and thoroughly understand the principles of state-of-the-art antenna measurement techniques. Topics such as Antenna Range Instrumentation, Near-Field Measurements, Multiple Probe Antenna Measurement Systems, Compact Ranges, Anechoic Chambers, Wireless Testing, EMI/EMC Testing, RCS Measurements, Radome Testing and Design of Far-Field Ranges are covered. The course is presented over a period of four days. This year's course, which was the fifth one that has been presented at UCLA, also included a tour of the UCLA antenna lab.

UCLA-Demo
 
UCLA-Demo

UCLA Antenna Test Facility

 
Daniel Janse van Rensburg discusses the history of the UCLA Short Course during the NSI sponsored reception
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Learn More About Near-field Antenna Measurements

If you've wondered about near-field measurements and whether they can improve your antenna measurements, see NSI's Near-field 101 page for a short tutorial on near-field measurements or view our on-line videos at http://www.nearfield.com/AMTV/index.htm.

For more information on NSI products and solutions, contact the NSI Sales Department.

Nearfield Systems Inc.
19730 Magellan Drive
Torrance, CA 90502 USA

Tel: 310-525-7000
Fax: 310-525-7100

www.nearfield.com

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