NSI 750S Sperical Near-Field System for Wireless Testing

This system consists of an integrated chamber/offset arm scanner provided by THC and motor control system and software from NSI. The system design represents a major advance for testing of wireless products. Specialized features include an offset mounted dielectric turntable to reduce truncation effects, false absorber walls with dielectric cross member to minimize reflections, orthogonally mounted linear probes to increase testing speed, and a drawbridge which facilitates test article access.