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| NSI-OP-5928 | |||||||||||||||||||||||||||||
XY
Optical Measurement Subsystem
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| DESCRIPTION
The NSI-OP-5928 XY Optical Measurement Subsystem is intended for use on vertical (figure above) or horizontal (figure below) planar near-field scanners to measure up to six parameters of distance and deformation of the probe line of travel. Two distance parameters include optical interferometer measurements of the X and Y travel. Four deformation parameters include the Yerr and Zyerr error as the probe moves in the X direction, and the Xerr and Zxerr error as the probe moves in the Y direction of travel. The NSI-OP-5928 XY Optical Measurement Subsystem includes the NSI-OP-5906A XY Optics Assembly, XY Laser, X and Y retroreflectors, laser alignment mirrors, DSP interface unit, software, cables, mounting brackets, installation and alignment on your scanner. |
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| CAPABILITIES
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FEATURES
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| DIMENSIONS
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| ORDERING
INFORMATION Please contact the NSI Sales department to order this subsystem. |
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| Nearfield
Systems, Incorporated 19730 Magellan Drive, Torrance, CA 90502, USA, Tel: 310.525.7000, Fax: 310.525.7100 Email: sales@nearfield.com. Visit our website: www.nearfield.com |
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